Fabrication of gallium nitride waveguide resonators by high-power impulse magnetron sputtering at room temperature

In this work, we demonstrate gallium nitride (GaN) waveguide resonators by sputtering amorphous GaN films on the silicon-based substrate. With the aid of high-power impulse magnetron sputtering (HiPIMS), high-quality, high-deposition-rate, and high-flatness GaN films can be deposited directly onto the silicon substrate with a 4 μm buried oxide layer at room temperature. Waveguide resonators with a quality factor of up to 4 × 10⁴ are demonstrated, and closely critical coupling is achieved at a 0.2 μm gap by optimizing the gap sizes, showing a high extinction ratio of waveguide resonators at ≈24 dB. The fabrication process of HiPIMS-GaN waveguide resonators utilizes CMOS-compatible techniques and operates at a low thermal budget. Compared to conventional GaN films fabricated using metal-organic chemical vapor deposition, this study offers the potential to produce low-cost GaN waveguides on amorphous substrates and realize integrated GaN photonics in optical communication, nonlinear photonics, and quantum photonics by high-quality HiPIMS films.