Eye prediction of digital driver with power distribution network noise

Chiu Chih Chou; Hao Hsiang Chuang; Tzong Lin Wu; Shih Hung Weng; Chung Kuan Cheng

doi:10.1109/EPEPS.2012.6457859

Eye prediction of digital driver with power distribution network noise

Chiu Chih Chou, Hao Hsiang Chuang, Tzong Lin Wu, Shih Hung Weng, Chung Kuan Cheng

Department of Electrical Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

9 Scopus citations

Abstract

Algorithms featuring fast and accurate estimation of worst-case eye diagram have been proposed to replace the time-consuming random bit simulation in channel design. However, when the interaction between nonlinear I/O circuits and power distribution network (PDN) noise is included, most of those approaches fail to maintain accuracy. Based on the superposition of multiple bit pattern responses (SMBP) concept, Ren and Oh [1] developed an algorithm to fast predict the eye diagram that theoretically captures any nonlinearity in the circuit. In this paper, a test circuit with PDN was constructed to examine the performance of this algorithm. The experiment results show good agreement with the results simulated by long PRBS in HSPICE.

Original language	English
Title of host publication	2012 IEEE 21st Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2012
Pages	131-134
Number of pages	4
DOIs	https://doi.org/10.1109/EPEPS.2012.6457859
State	Published - 2012
Event	2012 IEEE 21st Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2012 - Tempe, AZ, United States Duration: 21 Oct 2012 → 24 Oct 2012

Publication series

Name	2012 IEEE 21st Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2012

Conference

Conference	2012 IEEE 21st Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2012
Country/Territory	United States
City	Tempe, AZ
Period	21/10/12 → 24/10/12

Keywords

eye diagram
multiple bit pattern response
nonlinear effect
power distribution network
worst case estimation algorithm

Access to Document

10.1109/EPEPS.2012.6457859

Cite this

Chou, C. C., Chuang, H. H., Wu, T. L., Weng, S. H., & Cheng, C. K. (2012). Eye prediction of digital driver with power distribution network noise. In 2012 IEEE 21st Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2012 (pp. 131-134). [6457859] (2012 IEEE 21st Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2012). https://doi.org/10.1109/EPEPS.2012.6457859

Chou, Chiu Chih ; Chuang, Hao Hsiang ; Wu, Tzong Lin ; Weng, Shih Hung ; Cheng, Chung Kuan. / Eye prediction of digital driver with power distribution network noise. 2012 IEEE 21st Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2012. 2012. pp. 131-134 (2012 IEEE 21st Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2012).

@inproceedings{c0ccf600a8e043d2bfda642dc11228a2,

title = "Eye prediction of digital driver with power distribution network noise",

abstract = "Algorithms featuring fast and accurate estimation of worst-case eye diagram have been proposed to replace the time-consuming random bit simulation in channel design. However, when the interaction between nonlinear I/O circuits and power distribution network (PDN) noise is included, most of those approaches fail to maintain accuracy. Based on the superposition of multiple bit pattern responses (SMBP) concept, Ren and Oh [1] developed an algorithm to fast predict the eye diagram that theoretically captures any nonlinearity in the circuit. In this paper, a test circuit with PDN was constructed to examine the performance of this algorithm. The experiment results show good agreement with the results simulated by long PRBS in HSPICE.",

keywords = "eye diagram, multiple bit pattern response, nonlinear effect, power distribution network, worst case estimation algorithm",

author = "Chou, {Chiu Chih} and Chuang, {Hao Hsiang} and Wu, {Tzong Lin} and Weng, {Shih Hung} and Cheng, {Chung Kuan}",

year = "2012",

doi = "10.1109/EPEPS.2012.6457859",

language = "???core.languages.en_GB???",

isbn = "9781467325394",

series = "2012 IEEE 21st Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2012",

pages = "131--134",

booktitle = "2012 IEEE 21st Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2012",

note = "null ; Conference date: 21-10-2012 Through 24-10-2012",

}

Chou, CC, Chuang, HH, Wu, TL, Weng, SH & Cheng, CK 2012, Eye prediction of digital driver with power distribution network noise. in 2012 IEEE 21st Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2012., 6457859, 2012 IEEE 21st Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2012, pp. 131-134, 2012 IEEE 21st Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2012, Tempe, AZ, United States, 21/10/12. https://doi.org/10.1109/EPEPS.2012.6457859

Eye prediction of digital driver with power distribution network noise. / Chou, Chiu Chih; Chuang, Hao Hsiang; Wu, Tzong Lin; Weng, Shih Hung; Cheng, Chung Kuan.

2012 IEEE 21st Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2012. 2012. p. 131-134 6457859 (2012 IEEE 21st Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2012).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Eye prediction of digital driver with power distribution network noise

AU - Chou, Chiu Chih

AU - Chuang, Hao Hsiang

AU - Wu, Tzong Lin

AU - Weng, Shih Hung

AU - Cheng, Chung Kuan

PY - 2012

Y1 - 2012

N2 - Algorithms featuring fast and accurate estimation of worst-case eye diagram have been proposed to replace the time-consuming random bit simulation in channel design. However, when the interaction between nonlinear I/O circuits and power distribution network (PDN) noise is included, most of those approaches fail to maintain accuracy. Based on the superposition of multiple bit pattern responses (SMBP) concept, Ren and Oh [1] developed an algorithm to fast predict the eye diagram that theoretically captures any nonlinearity in the circuit. In this paper, a test circuit with PDN was constructed to examine the performance of this algorithm. The experiment results show good agreement with the results simulated by long PRBS in HSPICE.

AB - Algorithms featuring fast and accurate estimation of worst-case eye diagram have been proposed to replace the time-consuming random bit simulation in channel design. However, when the interaction between nonlinear I/O circuits and power distribution network (PDN) noise is included, most of those approaches fail to maintain accuracy. Based on the superposition of multiple bit pattern responses (SMBP) concept, Ren and Oh [1] developed an algorithm to fast predict the eye diagram that theoretically captures any nonlinearity in the circuit. In this paper, a test circuit with PDN was constructed to examine the performance of this algorithm. The experiment results show good agreement with the results simulated by long PRBS in HSPICE.

KW - eye diagram

KW - multiple bit pattern response

KW - nonlinear effect

KW - power distribution network

KW - worst case estimation algorithm

UR - http://www.scopus.com/inward/record.url?scp=84874484630&partnerID=8YFLogxK

U2 - 10.1109/EPEPS.2012.6457859

DO - 10.1109/EPEPS.2012.6457859

M3 - 會議論文篇章

AN - SCOPUS:84874484630

SN - 9781467325394

T3 - 2012 IEEE 21st Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2012

SP - 131

EP - 134

BT - 2012 IEEE 21st Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2012

Y2 - 21 October 2012 through 24 October 2012

ER -

Chou CC, Chuang HH, Wu TL, Weng SH, Cheng CK. Eye prediction of digital driver with power distribution network noise. In 2012 IEEE 21st Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2012. 2012. p. 131-134. 6457859. (2012 IEEE 21st Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2012). https://doi.org/10.1109/EPEPS.2012.6457859

Eye prediction of digital driver with power distribution network noise

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