Epitaxial lateral overgrowth of GaN on AlGaN/(111)Si micropillar array fabricated by polystyrene microsphere lithography

Guan Ting Chen, Chia Hua Chan, Chia Hung Hou, Hsueh Hsing Liu, Nai Wei Shiu, Mao Nan Chang, Chii Chang Chen, Jen Inn Chyi

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

The authors report on the growth of GaN on AlGaN/(111)Si micropillar array by metal-organic chemical vapor deposition. Using the substrates with micropillar array, 2 μm-thick GaN films without cracks can be achieved. Transmission electron microscopy, atomic force microscopy, and micro-Raman studies indicate that the dislocation density and residual stress of the GaN grown on micropillar array are also reduced. The results reveal the potential of this type of substrates for growing GaN-based devices as well as preparing GaN freestanding substrates.

Original languageEnglish
Title of host publicationGallium Nitride Materials and Devices III
DOIs
StatePublished - 2008
EventSociety of Photo-Optical Instrumentation Engineers (SPIE) - San Jose, CA, United States
Duration: 21 Jan 200824 Jan 2008

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume6894
ISSN (Print)0277-786X

Conference

ConferenceSociety of Photo-Optical Instrumentation Engineers (SPIE)
Country/TerritoryUnited States
CitySan Jose, CA
Period21/01/0824/01/08

Keywords

  • Dislocation
  • GaN
  • MOCVD
  • Si substrate

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