Energy straggling and multiple scattering in silicon strip detectors

T. Antičić, R. Battiston, W. Braunschweig, Y. H. Chang, C. Y. Chien, A. E. Chen, S. R. Hou, C. H. Lin, W. T. Lin, R. Ostonen, K. Spartiotis, O. Syben, O. Toker, B. Wittmer

Research output: Contribution to journalArticlepeer-review

5 Scopus citations

Abstract

We present a test beam study of energy straggling and multiple scattering in silicon strip detectors using electrons and pions of momenta up to 50 GeV. Results are compared with GEANT simulation using a simple algorithm to parameterize energy loss distribution. The deflection due to multiple scattering in crystalline structure was investigated by placing a GaAs wafer at various angles.

Original languageEnglish
Pages (from-to)309-314
Number of pages6
JournalNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume374
Issue number3
DOIs
StatePublished - 1 Jun 1996

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