Efficient FFT network testing and diagnosis schemes

Jin Fu Li, Cheng Wen Wu

Research output: Contribution to journalArticlepeer-review

3 Scopus citations


We consider offline testing, design-for-testability, and diagnosis for fast Fourier transform (FFT) networks. A practical FFT chip can contain millions of gates, so effective testing and fault-tolerance techniques usually are required in order to guarantee high-quality products. We propose M-testability conditions for FFT butterfly, omega, and flip networks at the double-multiply-subtract-add (DMSA) module level. A novel design-for-testability technique based on the functional bijectivity property of the specified modules to detect faults other than the cell faults is presented. It guarantees 100% combinational fault coverage with negligible hardware overhead-about 0.17% for an FFT network with 16-bit operand words, independent of the network size. Our design requires fewer test vectors compared with previous ones-a factor of up to 1/(6 × 2 5n), where n is the word length. We also propose C-diagnosability conditions and a C-diagnosable FFT network design. By properly exchanging and blocking certain fault propagation paths, a faulty DMSA module can be located using a two-phase deterministic algorithm. The blocking mechanism can be implemented with no additional hardware. Compared with previous schemes, our design reduces the diagnosis complexity from O(N) to O(1). For both testing and diagnosis, the hardware overhead for our approach is only about 0.43% for 16-bit numbers regardless of the FFT network size.

Original languageEnglish
Pages (from-to)267-277
Number of pages11
JournalIEEE Transactions on Very Large Scale Integration (VLSI) Systems
Issue number3
StatePublished - Jun 2002


  • Butterfly network
  • C-testable
  • Design-for-diagnosability
  • Design-for-testability
  • Diagnosis
  • Fa ult tolerance
  • Fast Fourier transform (FFT)
  • Logic testing
  • M-testable


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