Efficient diagnosis algorithms for drowsy SRAMs

Bing Wei Huang, Jin Fu Li

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Memory cores usually occupy a signif cant portion of the chip area of a complex system-on-chip. Thus, the yield of memory cores dominates the yield of the chip. Diagnosis and repair are two important techniques for memory yield improvement. In this paper, we propose two eff cient diagnosis algorithms for drowsy static random access memories (SRAMs). The f rst diagnosis algorithm, March D2, can be used to distinguish drowsy faults (DFs) from non-drowsy faults (NDFs). The second diagnosis algorithm, March D6, can distinguish different fault types of DFs. The March D2 and March D6 require 23N and (10log 2N+17)N Read/Write operations, respectively, for testing an N × W-bit drowsy SRAM.

Original languageEnglish
Title of host publicationProceedings of the 10th International Symposium on Quality Electronic Design, ISQED 2009
Pages276-279
Number of pages4
DOIs
StatePublished - 2009
Event10th International Symposium on Quality Electronic Design, ISQED 2009 - San Jose, CA, United States
Duration: 16 Mar 200918 Mar 2009

Publication series

NameProceedings of the 10th International Symposium on Quality Electronic Design, ISQED 2009

Conference

Conference10th International Symposium on Quality Electronic Design, ISQED 2009
Country/TerritoryUnited States
CitySan Jose, CA
Period16/03/0918/03/09

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