Abstract
This letter reports an InGaN light-emitting diode (LED) structure that has an n-type Al0.1Ga0.9N/GaN/In0.06Ga 0.94N current spreading layer under its multiple-quantum-well active region. As indicated by simulation, the Al0.1Ga0.9N/GaN/ In0.06Ga0.94N heterostructure induces a higher electron concentration than an n-AlGaN/GaN cladding layer and an n-GaN/InGaN current spreading layer that are used in conventional LEDs. As a result, the proposed n-type spreading layer is expected to alleviate current crowding and improve external quantum efficiency. Experimentally, the light output uniformity across the chips is greatly improved. The output power and wall-plug efficiency are enhanced by about 18.2% and 22.2% at an injection current of 350 mA for the LEDs employing the new double-heterostructure current spreading layer.
Original language | English |
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Article number | 6003754 |
Pages (from-to) | 1409-1411 |
Number of pages | 3 |
Journal | IEEE Electron Device Letters |
Volume | 32 |
Issue number | 10 |
DOIs | |
State | Published - Oct 2011 |
Keywords
- GaN
- InGaN
- light-emitting diodes (LEDs)