Effective refractive index change of X-cut Z-propagation Ti:LiNbO3 waveguides by laser ablation

Chii Chang Chen, Vincent Armbruster, Henri Porte, Alain Carenco, Jean Pierre Goedgebuer

Research output: Contribution to journalArticlepeer-review

Abstract

Laser ablation was applied to X-cut Z-propagation Ti:LiNbO3 waveguides. The effective refractive index change of the waveguides after the ablation was measured for both TE and TM modes. The change is more sensitive to the ablation for the TE than for the TM mode. This phenomenon was confirmed by measuring the modal effective refractive indices of a nonablated and an ablated planar Ti:LiNbO3 waveguide with the m-line method. A photoelastic effect that may cause the different effective index changes of the waveguide modes after ablation is discussed.

Original languageEnglish
Pages (from-to)2930-2934
Number of pages5
JournalOptical Engineering
Volume41
Issue number11
DOIs
StatePublished - Nov 2002

Keywords

  • Ablation
  • Integrated optics
  • LiNbO
  • Optical waveguides
  • Phase matching
  • Photoelastic materials
  • Polarization

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