Drop simulation/experimental verification and shock resistance improvement of TFT-LCD monitors

Min Chun Pan, Po Chun Chen

Research output: Contribution to journalArticlepeer-review

8 Scopus citations

Abstract

The study aims at developing a reliable procedure for evaluating the performance of TFT-LCD monitors in drop circumstances during transportation, as well as improving their shock resistance by design modification. The effective simulation model is completed by comparing with experimental verification through less severe drop laboratory for obtaining more effective data. Drop shock-induced transient phenomena are extensively discussed. To effectively improve the product for fulfilling the IEC drop-test regulations, three component modifications are proposed and verified. The applied approaches can even be broadened to other TFT-LCD products.

Original languageEnglish
Pages (from-to)2249-2259
Number of pages11
JournalMicroelectronics Reliability
Volume47
Issue number12
DOIs
StatePublished - Dec 2007

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