Digital modulation/demodulation measurement system within connected solution

Sy Haur Su; Shuw Guann Lin; Hsu Feng Hsiao; Da Chiang Chang; Hwann Kaeo Chiou

doi:10.1109/IMS3TW.2012.20

Digital modulation/demodulation measurement system within connected solution

Sy Haur Su, Shuw Guann Lin, Hsu Feng Hsiao, Da Chiang Chang, Hwann Kaeo Chiou

Department of Electrical Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

This paper proposes a digital modulation /demodulation measurement system implemented by the Agilent advanced design system (ADS)-connected solution with vector signal analyzer (VSA) software, VSA instrument built into an analog digital converter (ADC), and an ESG vector signal generator. The ADS system software is suitable to design a digital modulation signal for error vector magnitude (EVM) analysis in RF transmitter (TX). The bit error rate (BER) analysis in RF receiver (RX) was estimated by the recording file from VSA software simultaneously. The proposed testing platform can measure the characteristics of RF transceivers, such as EVM, BER, constellation, and eye diagrams. The nonlinearity and distortion properties were evaluated through the EVM system parameter.

Original language	English
Title of host publication	Proceedings of the 2012 IEEE 18th International Mixed-Signal, Sensors, and Systems Test Workshop, IMS3TW 2012
Pages	52-54
Number of pages	3
DOIs	https://doi.org/10.1109/IMS3TW.2012.20
State	Published - 2012
Event	2012 IEEE 18th International Mixed-Signal, Sensors, and Systems Test Workshop, IMS3TW 2012 - Taipei, Taiwan Duration: 14 May 2012 → 16 May 2012

Publication series

Name	Proceedings of the 2012 IEEE 18th International Mixed-Signal, Sensors, and Systems Test Workshop, IMS3TW 2012

Conference

Conference	2012 IEEE 18th International Mixed-Signal, Sensors, and Systems Test Workshop, IMS3TW 2012
Country/Territory	Taiwan
City	Taipei
Period	14/05/12 → 16/05/12

Keywords

ADC
BER
EVM

Access to Document

10.1109/IMS3TW.2012.20

Cite this

Su, S. H., Lin, S. G., Hsiao, H. F., Chang, D. C., & Chiou, H. K. (2012). Digital modulation/demodulation measurement system within connected solution. In Proceedings of the 2012 IEEE 18th International Mixed-Signal, Sensors, and Systems Test Workshop, IMS3TW 2012 (pp. 52-54). Article 6298716 (Proceedings of the 2012 IEEE 18th International Mixed-Signal, Sensors, and Systems Test Workshop, IMS3TW 2012). https://doi.org/10.1109/IMS3TW.2012.20

Su, Sy Haur ; Lin, Shuw Guann ; Hsiao, Hsu Feng et al. / Digital modulation/demodulation measurement system within connected solution. Proceedings of the 2012 IEEE 18th International Mixed-Signal, Sensors, and Systems Test Workshop, IMS3TW 2012. 2012. pp. 52-54 (Proceedings of the 2012 IEEE 18th International Mixed-Signal, Sensors, and Systems Test Workshop, IMS3TW 2012).

@inproceedings{c93e2538689a4dbb83d33a90a1eabed9,

title = "Digital modulation/demodulation measurement system within connected solution",

abstract = "This paper proposes a digital modulation /demodulation measurement system implemented by the Agilent advanced design system (ADS)-connected solution with vector signal analyzer (VSA) software, VSA instrument built into an analog digital converter (ADC), and an ESG vector signal generator. The ADS system software is suitable to design a digital modulation signal for error vector magnitude (EVM) analysis in RF transmitter (TX). The bit error rate (BER) analysis in RF receiver (RX) was estimated by the recording file from VSA software simultaneously. The proposed testing platform can measure the characteristics of RF transceivers, such as EVM, BER, constellation, and eye diagrams. The nonlinearity and distortion properties were evaluated through the EVM system parameter.",

keywords = "ADC, BER, EVM",

author = "Su, {Sy Haur} and Lin, {Shuw Guann} and Hsiao, {Hsu Feng} and Chang, {Da Chiang} and Chiou, {Hwann Kaeo}",

year = "2012",

doi = "10.1109/IMS3TW.2012.20",

language = "???core.languages.en_GB???",

isbn = "9780769547268",

series = "Proceedings of the 2012 IEEE 18th International Mixed-Signal, Sensors, and Systems Test Workshop, IMS3TW 2012",

pages = "52--54",

booktitle = "Proceedings of the 2012 IEEE 18th International Mixed-Signal, Sensors, and Systems Test Workshop, IMS3TW 2012",

note = "2012 IEEE 18th International Mixed-Signal, Sensors, and Systems Test Workshop, IMS3TW 2012 ; Conference date: 14-05-2012 Through 16-05-2012",

}

Su, SH, Lin, SG, Hsiao, HF, Chang, DC & Chiou, HK 2012, Digital modulation/demodulation measurement system within connected solution. in Proceedings of the 2012 IEEE 18th International Mixed-Signal, Sensors, and Systems Test Workshop, IMS3TW 2012., 6298716, Proceedings of the 2012 IEEE 18th International Mixed-Signal, Sensors, and Systems Test Workshop, IMS3TW 2012, pp. 52-54, 2012 IEEE 18th International Mixed-Signal, Sensors, and Systems Test Workshop, IMS3TW 2012, Taipei, Taiwan, 14/05/12. https://doi.org/10.1109/IMS3TW.2012.20

Digital modulation/demodulation measurement system within connected solution. / Su, Sy Haur; Lin, Shuw Guann; Hsiao, Hsu Feng et al.
Proceedings of the 2012 IEEE 18th International Mixed-Signal, Sensors, and Systems Test Workshop, IMS3TW 2012. 2012. p. 52-54 6298716 (Proceedings of the 2012 IEEE 18th International Mixed-Signal, Sensors, and Systems Test Workshop, IMS3TW 2012).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Digital modulation/demodulation measurement system within connected solution

AU - Su, Sy Haur

AU - Lin, Shuw Guann

AU - Hsiao, Hsu Feng

AU - Chang, Da Chiang

AU - Chiou, Hwann Kaeo

PY - 2012

Y1 - 2012

N2 - This paper proposes a digital modulation /demodulation measurement system implemented by the Agilent advanced design system (ADS)-connected solution with vector signal analyzer (VSA) software, VSA instrument built into an analog digital converter (ADC), and an ESG vector signal generator. The ADS system software is suitable to design a digital modulation signal for error vector magnitude (EVM) analysis in RF transmitter (TX). The bit error rate (BER) analysis in RF receiver (RX) was estimated by the recording file from VSA software simultaneously. The proposed testing platform can measure the characteristics of RF transceivers, such as EVM, BER, constellation, and eye diagrams. The nonlinearity and distortion properties were evaluated through the EVM system parameter.

AB - This paper proposes a digital modulation /demodulation measurement system implemented by the Agilent advanced design system (ADS)-connected solution with vector signal analyzer (VSA) software, VSA instrument built into an analog digital converter (ADC), and an ESG vector signal generator. The ADS system software is suitable to design a digital modulation signal for error vector magnitude (EVM) analysis in RF transmitter (TX). The bit error rate (BER) analysis in RF receiver (RX) was estimated by the recording file from VSA software simultaneously. The proposed testing platform can measure the characteristics of RF transceivers, such as EVM, BER, constellation, and eye diagrams. The nonlinearity and distortion properties were evaluated through the EVM system parameter.

KW - ADC

KW - BER

KW - EVM

UR - http://www.scopus.com/inward/record.url?scp=84868232582&partnerID=8YFLogxK

U2 - 10.1109/IMS3TW.2012.20

DO - 10.1109/IMS3TW.2012.20

M3 - 會議論文篇章

AN - SCOPUS:84868232582

SN - 9780769547268

T3 - Proceedings of the 2012 IEEE 18th International Mixed-Signal, Sensors, and Systems Test Workshop, IMS3TW 2012

SP - 52

EP - 54

BT - Proceedings of the 2012 IEEE 18th International Mixed-Signal, Sensors, and Systems Test Workshop, IMS3TW 2012

T2 - 2012 IEEE 18th International Mixed-Signal, Sensors, and Systems Test Workshop, IMS3TW 2012

Y2 - 14 May 2012 through 16 May 2012

ER -

Su SH, Lin SG, Hsiao HF, Chang DC, Chiou HK. Digital modulation/demodulation measurement system within connected solution. In Proceedings of the 2012 IEEE 18th International Mixed-Signal, Sensors, and Systems Test Workshop, IMS3TW 2012. 2012. p. 52-54. 6298716. (Proceedings of the 2012 IEEE 18th International Mixed-Signal, Sensors, and Systems Test Workshop, IMS3TW 2012). doi: 10.1109/IMS3TW.2012.20

Digital modulation/demodulation measurement system within connected solution

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