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Diagnosing Binary Content Addressable Memories with Comparison and RAM Faults
Jin Fu Li
Department of Electrical Engineering
Research output
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Contribution to journal
›
Article
›
peer-review
5
Scopus citations
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Keyphrases
System-on-chip
100%
Binary Content-addressable Memory
100%
Binary CAM
100%
Write Operation
33%
Comparison Faults
33%
Chip Area
33%
Content-addressable Memory
33%
Fault Type
33%
Diagnostic Process
33%
System Quality
33%
Diagnostic Resolution
33%
Memory Diagnosis
33%
Fault Identification Algorithm
33%
Computer Science
Content-Addressable Memory
100%
System-on-Chip
100%
Computer Aided Manufacturing
100%
Write Operation
33%
Identification Algorithm
33%
fault identification
33%
Diagnosis Phase
33%
Engineering
System-on-Chip
100%
Reliability Availability and Maintainability (Reliability Engineering)
100%
Computer Aided Manufacturing
100%
Chip Area
33%
Faulty Cell
33%