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Device stress evaluation of InAs/AlSb HEMT on silicon substrate with refractory iridium Schottky gate metal
Hsien Chin Chiu, Wen Yu Lin, Chia Yi Chou, Shih Hsien Yang, Kai Di Mai, Pei Chin Chiu, W. J. Hsueh, Jen Inn Chyi
Research output: Contribution to journal › Article › peer-review