Development pattern recognition model for the classification of circuit probe wafer maps on semiconductors

Keyphrases

• Accurate Classification 33%
• Blob 33%
• Bull's Eye 33%
• Circle-like 66%
• Circular Hough Transformation 33%
• Classification Approach 33%
• Cluster Type 33%
• Clustering Pattern 66%
• Comprehensive Evaluation 33%
• Cover Ratio 33%
• Data Mining Classification 33%
• Defect Clusters 33%
• Defect Pattern 100%
• Development Pattern 100%
• Fabrication Methods 66%
• Feature Extraction Methods 33%
• Feature Selection 33%
• Good Characteristics 33%
• Hollow 33%
• Hough Transform 33%
• Increased Reliability 33%
• Increased Yield 33%
• Integrated Circuit Manufacturing 100%
• Manufacturing Data 33%
• Pattern Recognition Model 100%
• Ratio Approach 66%
• Semiconductors 100%
• Spatial Defects 33%
• Wafer Map 100%

Engineering

• Feature Extraction 66%
• Integrated Circuit 100%
• Pattern Recognition 100%
• Recognition Model 100%

Material Science

• Electronic Circuit 100%
• Pattern Recognition 100%