Development of oxide film in aluminum melt

Li Wu Huang, Yeong Jern Chen, Teng Shih, Lih Ren Hwang

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Pure aluminum ingot (99.8 wt%) was melted to prepared chilled samples in this study. These samples were then removed to polish their surfaces and put in an ultrasonic cleaner filled with tap water. The polished surface would gradually show foggy marks after being subjected to a period of treating time. Oxide films, if entrapped, would crack, erode and detach from the chilled sample forming foggy marks on the polished surface. The sample then removed to measure oxygen and aluminum concentrations varied along the transition layer between the oxide film and aluminum matrix. Part of chilled samples was melted in a muffle furnace and subjected to different holding time. As the holding time increased, the transition layer between the oxide film and the matrix was increased and composed of different constituents varying from the Al matrix to the oxide film (mainly γ -Al2O3). This transition layer also showed different hardness measured by a nano-hardness tester. The morphologies of cracked oxide film and the eroded oxide particles were affected by the holding time after melted, and small amounts of silicon in the pure aluminum.

Original languageEnglish
Title of host publicationAluminium Alloys 2006
Subtitle of host publicationResearch Through Innovation and Technology - Proceedings of the 10th International Conference on Aluminium Alloys
PublisherTrans Tech Publications Ltd
Pages1311-1316
Number of pages6
EditionPART 2
ISBN (Print)9780878494088
StatePublished - 2006
Event10th International Conference on Aluminium Alloys, (ICAA-10) - Vancouver, Canada
Duration: 9 Jul 200613 Jul 2006

Publication series

NameMaterials Science Forum
NumberPART 2
Volume519-521
ISSN (Print)0255-5476
ISSN (Electronic)1662-9752

Conference

Conference10th International Conference on Aluminium Alloys, (ICAA-10)
Country/TerritoryCanada
CityVancouver
Period9/07/0613/07/06

Keywords

  • Foggy mark
  • Interfacial layer
  • Oxide film
  • y-AlO

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