Determining quality of microcrystal silicon thin films based on infrared absorption coefficients

Sheng Hui Chen, Hung Ju Lin, Ting Wei Chang, Hsuan Wen Wang, Cheng Chung Lee, Chun Ming Yeh, Yen Yu Pan

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

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Engineering & Materials Science

Physics & Astronomy