@inproceedings{58ad65ef69ea49c6afb9876f6e39d1c1,
title = "Determining quality of microcrystal silicon thin films based on infrared absorption coefficients",
abstract = "We proposed the absorption coefficient ratio of (1.4 eV)/ (0.8 eV) as the quality factor of microcrystalline silicon thin films. It is convinced that a proportional relationship is between quality factor and solar cell efficiency.",
author = "Chen, \{Sheng Hui\} and Lin, \{Hung Ju\} and Chang, \{Ting Wei\} and Wang, \{Hsuan Wen\} and Lee, \{Cheng Chung\} and Yeh, \{Chun Ming\} and Pan, \{Yen Yu\}",
year = "2010",
language = "???core.languages.en\_GB???",
isbn = "9781557528919",
series = "Optics InfoBase Conference Papers",
booktitle = "Optical Interference Coatings, OIC 2010",
note = "Optical Interference Coatings, OIC 2010 ; Conference date: 06-06-2010 Through 11-06-2010",
}