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Design of high-performance and highly reliable nMOSFETs with embedded Si:C S/D extension stressor(Si:C S/D-E)
Steve S. Chung, E. R. Hsieh, P. W. Liu, W. T. Chiang, S. H. Tsai, T. L. Tsai, R. M. Huang, C. H. Tsai, W. Y. Teng, C. I. Li, T. F. Kuo, Y. R. Wang, C. L. Yang, C. T. Tsai, G. H. Ma, S. C. Chien, S. W. Sun
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
7
Scopus
citations