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Design, fabrication, and reliability testing of embedded optical interconnects on package
Shashikant Hegde, Raghuram V. Pucha, Daniel Guidotti, Fuhan Liu, Yin Jung Chang, Rao Tummala, Gee Kung Chang, Suresh K. Sitaraman
Research output: Contribution to journal › Conference article › peer-review
9
Scopus
citations