Design and control of phase-detection mode atomic force microscopy for cells precision contour reconstruction under different environments

Keyphrases

• Atomic Force Microscopy 100%
• Phase Detection 100%
• Detection Mode 100%
• Contour Reconstruction 100%
• Controller 50%
• High Sensitivity 50%
• Measuring System 50%
• Microstructure 50%
• Image Quality 50%
• Grating 50%
• Positioning Accuracy 50%
• Nanometer Scale 50%
• Inconvenience 50%
• Fast Response 50%
• Atomic Force Microscope 50%
• Scanning Accuracy 50%
• Complementary Sliding Mode 50%
• Sliding Mode Controller 50%
• Phase Feedback 50%
• Feedback Device 50%
• Scanning System 50%
• Piezoelectric Positioning Stage 50%
• Double Integral Sliding Mode Control 50%
• Use Phase 50%
• Scanned Image 50%
• Cell Size 50%
• 3D Imaging 50%
• Sensitivity Response 50%
• Tender 50%
• DVD pick-up Head 50%
• Sub-nano 50%
• Cell Topography 50%
• Integration Controller 50%
• Planar Scanner 50%
• Cantilever Deflection 50%

Engineering

• Atomic Force Microscopy 100%
• Experimental Result 50%
• Microstructure 50%
• Multiple-Input Multiple-Output 50%
• Piezoelectric 50%
• Nanometre 50%
• Fast Response 50%
• Atomic Force Microscope 50%
• Sliding-Mode Controller 50%
• Feedback Signal 50%
• Sliding Mode Controller 50%