Deep Learning Multi-objective Optimization for Smart Manufacturing via Elitist Genetic Algorithm

Jehn Ruey Jiang, Si Han Chen

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

This paper proposes a deep learning multi-objective optimization (DL-MOO) method for smart manufacturing to generate wire electrical discharge machining (WEDM) parameters via an elitist genetic algorithm with the deep neural network (DNN) and the transfer learning mechanism. Given multiple objectives, the proposed method can generate WEDM manufacturing parameters to optimize the multiple objectives at the same time. Practical experiments are conducted to validate the proposed method.

Original languageEnglish
Title of host publication2023 International Conference on Consumer Electronics - Taiwan, ICCE-Taiwan 2023 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages545-546
Number of pages2
ISBN (Electronic)9798350324174
DOIs
StatePublished - 2023
Event2023 International Conference on Consumer Electronics - Taiwan, ICCE-Taiwan 2023 - Pingtung, Taiwan
Duration: 17 Jul 202319 Jul 2023

Publication series

Name2023 International Conference on Consumer Electronics - Taiwan, ICCE-Taiwan 2023 - Proceedings

Conference

Conference2023 International Conference on Consumer Electronics - Taiwan, ICCE-Taiwan 2023
Country/TerritoryTaiwan
CityPingtung
Period17/07/2319/07/23

Keywords

  • deep learning
  • elitist genetic algorithm
  • multi-objective optimization
  • smart manufacturing
  • transfer learning
  • wire electrical discharge machining

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