Cu Nanoparticle Sintering by Electrical Current

Albert T. Wu, Tzu Hao Sheng, Jui Lin Chao, Chang Meng Wang, Watson Tseng

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In this research, copper nanoparticles are packed into a V-shaped groove etched on a silicon substrate to explore how electric current affects their sintering process. This sintering is effectively carried out at a room temperature of 25°C. U sing an electrical current in the sintering process significantly reduces void formation in the copper, which is a notable improvement over non-electrically assisted methods. Conducting the process at ambient temperature is beneficial as it minimizes the effects of Joule heating. Critical aspects of this process involve the stimulation of atomic movement by the electric current and the migration of atoms over the surfaces of the particles. There is a particular focus on the current crowding phenomenon that occurs in the narrow regions between particles. The study aims to elucidate the importance of how electric current impacts the compaction and electrical properties of copper nanoparticles.

Original languageEnglish
Title of host publication2024 International Conference on Electronics Packaging, ICEP 2024
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages107-108
Number of pages2
ISBN (Electronic)9784991191176
DOIs
StatePublished - 2024
Event23rd International Conference on Electronics Packaging, ICEP 2024 - Toyama, Japan
Duration: 17 Apr 202420 Apr 2024

Publication series

Name2024 International Conference on Electronics Packaging, ICEP 2024

Conference

Conference23rd International Conference on Electronics Packaging, ICEP 2024
Country/TerritoryJapan
CityToyama
Period17/04/2420/04/24

Keywords

  • Cu nanoparticle
  • Current crowding
  • Electrical current
  • Joule heating
  • Sintering

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