Crystallographic Orientation Effect on Electromigration in Ni-Sn Microbump

Yi Ting Huang, Chih Hao Chen, Subhendu Chakroborty, Albert T. Wu

Research output: Contribution to journalArticlepeer-review

5 Scopus citations

Abstract

This article addresses the reliability challenges regarding electromigration in developing three-dimensional integrated circuits (3D-ICs). The line-type sandwich structure of Ni/Sn3.5Ag(15 μm)/Ni was used to simulate microbumps to examine the reliability of electromigration in 3D-IC technology. The solder strip of Ni/Sn3.5Ag(15 μm)/Ni was stressed with a current density of 1.0 × 104 A/cm2 at 150°C. The current stressing enhanced the reaction between the solder and Ni to form Ni3Sn4, which occupied the entire joint and transformed into a Ni/Ni3Sn4/Ni structure when the solder was completely consumed. Electron backscatter diffraction was used to analyze the crystallographic characteristics of Sn and Ni3Sn4 as related to the electromigration effect. The results indicated that the crystallographic orientation of Sn plays a significant role in the Ni/Sn3.5Ag/Ni, whereas the orientation of Ni3Sn4 is the dominant factor of diffusion behavior in the Ni/Ni3Sn4/Ni.

Original languageEnglish
Pages (from-to)1717-1723
Number of pages7
JournalJOM
Volume69
Issue number9
DOIs
StatePublished - 1 Sep 2017

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