Critical time of the lognormal distribution

Research output: Contribution to journalArticlepeer-review

3 Scopus citations

Abstract

The critical time is the time point as the failure rate starts to decrease and also as the mean residual lifetime starts to increase. The estimated critical time is useful for determining the duration of a burn-in process. The method for estimating the critical time of the failure rate for lognormal lifetime distribution is discussed. A single time censored data is used as a example for illustration.

Original languageEnglish
Pages (from-to)261-266
Number of pages6
JournalMicroelectronics Reliability
Volume34
Issue number2
DOIs
StatePublished - Feb 1994

Fingerprint

Dive into the research topics of 'Critical time of the lognormal distribution'. Together they form a unique fingerprint.

Cite this