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Core-based system-on-chip testing: Challenges and opportunities
C. W. Wu
,
J. F. Li
, C. T. Huang
Department of Electrical Engineering
Research output
:
Contribution to journal
›
Article
›
peer-review
10
Scopus citations
Overview
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Keyphrases
Core-Based
100%
On-chip Testing
100%
Automated Testing
75%
System-on-chip
50%
Core Test
50%
Test Pattern
50%
Chip Test
50%
Popular
25%
Test Wrapper
25%
Plug-and-play
25%
System-on-chip Design
25%
Deep Submicron Technology
25%
Integrated chip
25%
Opportunities for Research
25%
Technology System
25%
Test Scheduling
25%
Automation Etc
25%
Test Access
25%
Test Interface
25%
VLSI chip
25%
Test Integration
25%
Computer Science
System-on-Chip
100%
Test Automation
42%
Research Topic
14%
Technology System
14%
Integration Test
14%
Medicine and Dentistry
Language Test
100%
Engineering
System-on-Chip
100%