Abstract
This work presents a current-mode control and observation structure (CMCOS) for analog circuits with current test data. Current store cells (CSCs) are used in the proposed CMCOS to enhance the controllability and observability. The proposed CMCOS can be used to observe several test points, which can be simultaneously sampled and controlled using current test data. Additionally, the proposed CMCOS enables designers to use one channel of an oscilloscope to monitor simultaneously several output waveforms of analog circuits or systems. The physical chip of a two-stage CMCOS was fabricated using TSMC 1P4M CMOS 0.35 um technology. Also, experiments were performed to confirm the theoretical analysis.
Original language | English |
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Pages (from-to) | 39-44 |
Number of pages | 6 |
Journal | Journal of Electronic Testing: Theory and Applications (JETTA) |
Volume | 20 |
Issue number | 1 |
DOIs | |
State | Published - Feb 2004 |
Keywords
- Analog circuit
- Controllability
- Current store cell (CSC)
- Current-mode
- Observability