Control and Observation Structure for Analog Circuits with Current Test Data

Research output: Contribution to journalArticlepeer-review

5 Scopus citations

Abstract

This work presents a current-mode control and observation structure (CMCOS) for analog circuits with current test data. Current store cells (CSCs) are used in the proposed CMCOS to enhance the controllability and observability. The proposed CMCOS can be used to observe several test points, which can be simultaneously sampled and controlled using current test data. Additionally, the proposed CMCOS enables designers to use one channel of an oscilloscope to monitor simultaneously several output waveforms of analog circuits or systems. The physical chip of a two-stage CMCOS was fabricated using TSMC 1P4M CMOS 0.35 um technology. Also, experiments were performed to confirm the theoretical analysis.

Original languageEnglish
Pages (from-to)39-44
Number of pages6
JournalJournal of Electronic Testing: Theory and Applications (JETTA)
Volume20
Issue number1
DOIs
StatePublished - Feb 2004

Keywords

  • Analog circuit
  • Controllability
  • Current store cell (CSC)
  • Current-mode
  • Observability

Fingerprint

Dive into the research topics of 'Control and Observation Structure for Analog Circuits with Current Test Data'. Together they form a unique fingerprint.

Cite this