Constant stress accelerated life test on a multiple-component series system under weibull lifetime distributions

Tsai Hung Fan, Tsung Ming Hsu

Research output: Contribution to journalArticlepeer-review

16 Scopus citations

Abstract

We will discuss the reliability analysis of the constant stress accelerated life test on a series system connected with multiple components under independent Weibull lifetime distributions whose scale parameters are log-linear in the level of the stress variable. The system lifetimes are collected under Type I censoring but the components that cause the systems to fail may or may not be observed. The data are so called masked for the latter case. Maximum likelihood approach and the Bayesian method are considered when the data are masked. Statistical inference on the estimation of the underlying model parameters as well as the mean time to failure and the reliability function will be addressed. Simulation study for a three-component case shows that Bayesian analysis outperforms the maximum likelihood approach especially when the data are highly masked.

Original languageEnglish
Pages (from-to)2370-2383
Number of pages14
JournalCommunications in Statistics - Theory and Methods
Volume43
Issue number10-12
DOIs
StatePublished - 15 May 2014

Keywords

  • Accelerated life tests
  • masked data
  • Series system
  • Weibull distributions

Fingerprint

Dive into the research topics of 'Constant stress accelerated life test on a multiple-component series system under weibull lifetime distributions'. Together they form a unique fingerprint.

Cite this