TY - JOUR
T1 - Conference Reports
T2 - Report on 2017 IEEE Asian Test Symposium
AU - Li, Jin Fu
AU - Huang, Jiun Lang
N1 - Publisher Copyright:
© 2013 IEEE.
PY - 2018/4
Y1 - 2018/4
N2 - The Asian Test Symposium 2017 (ATS'17) was held during 27-30 November 2017 at Palais de Chine Hotel, Taipei, Taiwan. The ATS has been the largest event in Asia that focuses on the testing of integrated circuits and systems, and it has attracted researchers and engineers from all over the world to share their experiences and knowledge. ATS'17 was organized by the National Central University, which cosponsored the event jointly with IEEE Test Technology Technical Council. ATS'17 was also supported by the following corporate sponsors: Ministry of Science Technology, Bureau of Foreign Trade, Ministry of Education, Taipei Department of Information and Tourism, Synopsys, Mentor Graphics, Cadence, Industrial Technology Research Institute (ITRI), and Realtek.
AB - The Asian Test Symposium 2017 (ATS'17) was held during 27-30 November 2017 at Palais de Chine Hotel, Taipei, Taiwan. The ATS has been the largest event in Asia that focuses on the testing of integrated circuits and systems, and it has attracted researchers and engineers from all over the world to share their experiences and knowledge. ATS'17 was organized by the National Central University, which cosponsored the event jointly with IEEE Test Technology Technical Council. ATS'17 was also supported by the following corporate sponsors: Ministry of Science Technology, Bureau of Foreign Trade, Ministry of Education, Taipei Department of Information and Tourism, Synopsys, Mentor Graphics, Cadence, Industrial Technology Research Institute (ITRI), and Realtek.
UR - http://www.scopus.com/inward/record.url?scp=85041376230&partnerID=8YFLogxK
U2 - 10.1109/MDAT.2018.2800286
DO - 10.1109/MDAT.2018.2800286
M3 - 期刊論文
AN - SCOPUS:85041376230
SN - 2168-2356
VL - 35
SP - 103
EP - 104
JO - IEEE Design and Test
JF - IEEE Design and Test
IS - 2
ER -