@inproceedings{6ce4d207d36e4e9f82702bba5fb5185e,

title = "Complete test set for multiple-valued logic networks",

abstract = "A complete test set (CTS) is defined and derived for multiple-valued logic (MVL) Min/Max networks. The CTS can detect any single and multiple stuck-at faults of the MVL Min/Max network regardless of its implementation. Two splitting algorithms to generate the CTS for a given MVL function are proposed. One algorithm demonstrates over 2 orders speed improvement and 3 orders memory savings and the other algorithm demonstrates over 4 orders speed improvement and 2 orders memory savings with respect to the conventional truth table enumerating method.",

author = "Wang, {Hui Min} and Lee, {Chung Len} and Chen, {Jwu E.}",

year = "1994",

language = "???core.languages.en_GB???",

isbn = "0818656522",

series = "Proceedings of The International Symposium on Multiple-Valued Logic",

publisher = "Publ by IEEE",

pages = "289--296",

booktitle = "Proceedings of The International Symposium on Multiple-Valued Logic",

note = "Proceedings of the 24th International Symposium on Multiple-Valued Logic ; Conference date: 25-05-1994 Through 27-05-1994",

}