TY - GEN
T1 - Comparative Study of the Causality Property of Various Conductor Surface Roughness Models
AU - Chou, Chiu Chih
N1 - Publisher Copyright:
© 2021 IEEE.
PY - 2021/8/25
Y1 - 2021/8/25
N2 - Accurate modeling of conductor roughness is crucial for signal integrity analysis. Various models have been proposed in the literature, while many of the commonly-used ones are not causal, meaning that the time domain waveform will have nonphysical precursors before the actual arrival of the signal. The causality issue has been addressed in a few papers, while there is a lack of a thorough comparison between the available models. In this paper, through a 7-inch microstrip line example, we compare the causality of six models: Hammerstad, modified Hammerstad, causal Hammerstad, hemisphere, Huray, and causal Huray. It is found that the hemisphere and Huray models can have a> 10 mV precursor, the Hammerstad models have smaller precursor (<4 mV) due to its fast saturation, whereas all causal models have no precursors.
AB - Accurate modeling of conductor roughness is crucial for signal integrity analysis. Various models have been proposed in the literature, while many of the commonly-used ones are not causal, meaning that the time domain waveform will have nonphysical precursors before the actual arrival of the signal. The causality issue has been addressed in a few papers, while there is a lack of a thorough comparison between the available models. In this paper, through a 7-inch microstrip line example, we compare the causality of six models: Hammerstad, modified Hammerstad, causal Hammerstad, hemisphere, Huray, and causal Huray. It is found that the hemisphere and Huray models can have a> 10 mV precursor, the Hammerstad models have smaller precursor (<4 mV) due to its fast saturation, whereas all causal models have no precursors.
KW - causality
KW - surface roughness
KW - transmission line
UR - http://www.scopus.com/inward/record.url?scp=85118099001&partnerID=8YFLogxK
U2 - 10.1109/RFIT52905.2021.9565274
DO - 10.1109/RFIT52905.2021.9565274
M3 - 會議論文篇章
AN - SCOPUS:85118099001
T3 - 2021 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2021
BT - 2021 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2021
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2021 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2021
Y2 - 25 August 2021 through 27 August 2021
ER -