Common-path heterodyne interferometric detection scheme for measuring wavelength shift

Ju Yi Lee; Der Chin Su

doi:10.1016/S0030-4018(99)00074-7

Common-path heterodyne interferometric detection scheme for measuring wavelength shift

Ju Yi Lee, Der Chin Su

Department of Mechanical Engineering

Research output: Contribution to journal › Article › peer-review

7 Scopus citations

Abstract

When a linearly polarized light passes through a uniaxial crystal, small wavelength shifts will introduce phase difference variations between s- and p-polarizations. These phase difference variations can be measured accurately by heterodyne interferometry. Based on these facts, a common-path heterodyne interferometric detection scheme for measuring wavelength shift is proposed. This scheme has the advantages of both common-path interferometry and heterodyne interferometry.

Original language	English
Pages (from-to)	7-10
Number of pages	4
Journal	Optics Communications
Volume	162
Issue number	1
DOIs	https://doi.org/10.1016/S0030-4018(99)00074-7
State	Published - 1 Apr 1999

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title = "Common-path heterodyne interferometric detection scheme for measuring wavelength shift",

abstract = "When a linearly polarized light passes through a uniaxial crystal, small wavelength shifts will introduce phase difference variations between s- and p-polarizations. These phase difference variations can be measured accurately by heterodyne interferometry. Based on these facts, a common-path heterodyne interferometric detection scheme for measuring wavelength shift is proposed. This scheme has the advantages of both common-path interferometry and heterodyne interferometry.",

author = "Lee, {Ju Yi} and Su, {Der Chin}",

note = "Funding Information: This study was supported in part by the National Science Council, Taiwan, under contract NSC 86-2215-E-009-013.",

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AU - Lee, Ju Yi

AU - Su, Der Chin

N1 - Funding Information: This study was supported in part by the National Science Council, Taiwan, under contract NSC 86-2215-E-009-013.

PY - 1999/4/1

Y1 - 1999/4/1

N2 - When a linearly polarized light passes through a uniaxial crystal, small wavelength shifts will introduce phase difference variations between s- and p-polarizations. These phase difference variations can be measured accurately by heterodyne interferometry. Based on these facts, a common-path heterodyne interferometric detection scheme for measuring wavelength shift is proposed. This scheme has the advantages of both common-path interferometry and heterodyne interferometry.

AB - When a linearly polarized light passes through a uniaxial crystal, small wavelength shifts will introduce phase difference variations between s- and p-polarizations. These phase difference variations can be measured accurately by heterodyne interferometry. Based on these facts, a common-path heterodyne interferometric detection scheme for measuring wavelength shift is proposed. This scheme has the advantages of both common-path interferometry and heterodyne interferometry.

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U2 - 10.1016/S0030-4018(99)00074-7

DO - 10.1016/S0030-4018(99)00074-7

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JO - Optics Communications

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Common-path heterodyne interferometric detection scheme for measuring wavelength shift

Abstract

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