Checkpoints in irredundant two-level combinational circuits

Jwu E. Chen; Chung Len Lee; Wen Zen Shen

doi:10.1007/BF00135233

Checkpoints in irredundant two-level combinational circuits

Jwu E. Chen, Chung Len Lee, Wen Zen Shen

Department of Electrical Engineering

Research output: Contribution to journal › Letter › peer-review

1 Scopus citations

Abstract

It is shown that for a two-level irredundant single/multiple output combinational circuit, the checkpoints consist of all primary inputs without fanout, and all fanout branches in the circuit. Any test set that detects all single stuck faults on these checkpoints will also detect all single stuck faults in the circuit.

Original language	English
Pages (from-to)	395-397
Number of pages	3
Journal	Journal of Electronic Testing: Theory and Applications (JETTA)
Volume	2
Issue number	4
DOIs	https://doi.org/10.1007/BF00135233
State	Published - Nov 1991

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title = "Checkpoints in irredundant two-level combinational circuits",

abstract = "It is shown that for a two-level irredundant single/multiple output combinational circuit, the checkpoints consist of all primary inputs without fanout, and all fanout branches in the circuit. Any test set that detects all single stuck faults on these checkpoints will also detect all single stuck faults in the circuit.",

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AU - Shen, Wen Zen

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N2 - It is shown that for a two-level irredundant single/multiple output combinational circuit, the checkpoints consist of all primary inputs without fanout, and all fanout branches in the circuit. Any test set that detects all single stuck faults on these checkpoints will also detect all single stuck faults in the circuit.

AB - It is shown that for a two-level irredundant single/multiple output combinational circuit, the checkpoints consist of all primary inputs without fanout, and all fanout branches in the circuit. Any test set that detects all single stuck faults on these checkpoints will also detect all single stuck faults in the circuit.

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M3 - 通訊期刊論文

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SN - 0923-8174

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EP - 397

JO - Journal of Electronic Testing: Theory and Applications (JETTA)

JF - Journal of Electronic Testing: Theory and Applications (JETTA)

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Checkpoints in irredundant two-level combinational circuits

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