Checkpoints in irredundant two-level combinational circuits

Jwu E. Chen, Chung Len Lee, Wen Zen Shen

Research output: Contribution to journalLetterpeer-review

1 Scopus citations


It is shown that for a two-level irredundant single/multiple output combinational circuit, the checkpoints consist of all primary inputs without fanout, and all fanout branches in the circuit. Any test set that detects all single stuck faults on these checkpoints will also detect all single stuck faults in the circuit.

Original languageEnglish
Pages (from-to)395-397
Number of pages3
JournalJournal of Electronic Testing: Theory and Applications (JETTA)
Issue number4
StatePublished - Nov 1991


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