Characterizing the wetting of metallic thin films with angle-resolved photoelectron spectroscopy

Dah An Luh, Kuan Chun Liu, Cheng Maw Cheng, Ku Ding Tsuei

Research output: Contribution to journalArticlepeer-review

3 Scopus citations

Abstract

The wetting of thin Ag films on Cu(111) is characterized in detail with angle-resolved photoelectron spectroscopy. After constructing disordered Ag films on Cu(111), we monitored the evolution of their layer-resolved Shockley states during wetting. Our results provide the first observation of a transitional state, which implies a coexistence of clean Cu(111), 1 ML of Ag on Cu(111), and 2 ML of Ag on Cu(111). The evolution of these Shockley states indicates a two-process model of wetting.

Original languageEnglish
Article number075434
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume82
Issue number7
DOIs
StatePublished - 31 Aug 2010

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