Characterization of PZT thin films by sol-gel method in application of resonant sensor

J. Z. Tsai, C. J. Chen, C. W. Hsiao, D. T. Hsieh, Y. M. Hsin

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Micrometer-scale piezoelectric PZT sensors for gravimetric applications were developed. The PZT thin films were fabricated with sol-gel PZT and were of 400 × 400 um2 working area. Optical microscopy, scanning electron microscopy, leakage current density analysis, and C-V characterization were employed to evaluate the structure as well as successfulness of the microfabrication process. A resonance measurement circuit, which transformed the resonance frequency signal to a DC level, was built to characterize the gravimetric ability of the PZT sensors. Change of mass on the PZT sensor can be detected by observing the DC shift at the output of the detection circuit.

Original languageEnglish
Title of host publication2nd International Conference on Bioinformatics and Biomedical Engineering, iCBBE 2008
PublisherIEEE Computer Society
Pages196-198
Number of pages3
ISBN (Print)9781424417483
DOIs
StatePublished - 2008
Event2nd International Conference on Bioinformatics and Biomedical Engineering, iCBBE 2008 - Shanghai, China
Duration: 16 May 200818 May 2008

Publication series

Name2nd International Conference on Bioinformatics and Biomedical Engineering, iCBBE 2008

Conference

Conference2nd International Conference on Bioinformatics and Biomedical Engineering, iCBBE 2008
Country/TerritoryChina
CityShanghai
Period16/05/0818/05/08

Keywords

  • Gravimetric
  • PZT
  • Piezoelectric
  • Resonant

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