Characterization of coumarin-6 polycrystalline films growth from vacuum deposition at various substrate temperatures

Ko Lun Chen, Hui Ting Liu, Jang Hung Yu, Yung Hsiang Tung, Yun Syuan Chou, Chun Chuen Yang, Jyh Shyang Wang, Ji Lin Shen, Kuan Cheng Chiu

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Coumarin-6 polycrystalline films were fabricated from vacuum deposition at various substrate temperatures Tsub from 106 to 178 °C with a fixed source temperature of 185 °C. Because of its slenderer and more asymmetric structure, the adhered coumarin-6 molecule on top of the growing interface encounters a larger steric energetic barrier of 0.92 eV as estimated from the Arrhenius plot of growth rate versus 1/Tsub. From top-view SEM pictures, the as-deposited coumarin-6 thin films exhibit a twisted pattern and a kinematic roughness for Tsub < 150 °C; while clear facets emerge for Tsub ≥ 150 °C due to the increase of surface diffusion energy of the adhered molecules. From XRD analysis, besides the confirmation of the triclinic structure two anomalous peaks observed at 2θ ~ 9.007° and 7.260° are explained due to the co-existence of N- and S-coumarin-6-isomers within the crystalline grains. Furthermore, for coumarin-6 polycrystalline films deposited at Tsub = 150 °C with high crystallinity of the constituent grains, the bandgap determined from optical transmission is around 2.392 eV; and from photoluminescence spectra, the fitted four emission components are assigned to the Frenkel and charge transfer excitons recombination with participation of molecular vibrational states.

Original languageEnglish
Article number16740
JournalScientific Reports
Issue number1
StatePublished - 1 Dec 2018


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