Capacitance studies of Nd2CuO4

J. W. Chen, J. C. Wang, Y. F. Chen

Research output: Contribution to journalArticlepeer-review

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Abstract

We have studied the dielectric properties of the Nd2CuO4 samples that were annealed under different conditions by means of capacitance C(T,ω) and dissipation factor D(T,ω) measurements with the test frequency ω in the range 20 Hz to 1 MHz and at temperature T between 5 K and 325 K. We observed two frequency-dependent peaks in the D(T,ω) curves and corresponding features in the C(T,ω) curevs. The first peak occurs at T ≈ 250 K is due to the occurrence of the antiferromagnetic transition in the sample and the second one occurs at T ≈ 120 K is related to the change of the conduction mechanism in this system.

Original languageEnglish
Pages (from-to)583-587
Number of pages5
JournalChinese Journal of Physics
Volume34
Issue number2 II
StatePublished - 1996

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