We have studied the dielectric properties of the Nd2CuO4 samples that were annealed under different conditions by means of capacitance C(T,ω) and dissipation factor D(T,ω) measurements with the test frequency ω in the range 20 Hz to 1 MHz and at temperature T between 5 K and 325 K. We observed two frequency-dependent peaks in the D(T,ω) curves and corresponding features in the C(T,ω) curevs. The first peak occurs at T ≈ 250 K is due to the occurrence of the antiferromagnetic transition in the sample and the second one occurs at T ≈ 120 K is related to the change of the conduction mechanism in this system.
|Number of pages||5|
|Journal||Chinese Journal of Physics|
|Issue number||2 II|
|State||Published - 1996|