BUILT-IN TEST FOR VLSI FINITE-STATE MACHINES.

Kien A. Hua, Jing Yang Jou, Jacob A. Abraham

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

26 Scopus citations
Original languageEnglish
Title of host publicationDigest of Papers - FTCS (Fault-Tolerant Computing Symposium)
PublisherIEEE
Pages292-297
Number of pages6
ISBN (Print)0818605405
StatePublished - 1984

Publication series

NameDigest of Papers - FTCS (Fault-Tolerant Computing Symposium)
ISSN (Print)0731-3071

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