BUILT-IN TEST FOR VLSI FINITE-STATE MACHINES.

Kien A. Hua, Jing Yang Jou, Jacob A. Abraham

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

27 Scopus citations

Original language	English
Title of host publication	Digest of Papers - FTCS (Fault-Tolerant Computing Symposium)
Publisher	IEEE
Pages	292-297
Number of pages	6
ISBN (Print)	0818605405
State	Published - 1984

Name	Digest of Papers - FTCS (Fault-Tolerant Computing Symposium)
ISSN (Print)	0731-3071

Cite this

@inproceedings{53d1ed940ede43368167dc845c00b979,

title = "BUILT-IN TEST FOR VLSI FINITE-STATE MACHINES.",

author = "Hua, {Kien A.} and Jou, {Jing Yang} and Abraham, {Jacob A.}",

year = "1984",

language = "???core.languages.en_GB???",

isbn = "0818605405",

series = "Digest of Papers - FTCS (Fault-Tolerant Computing Symposium)",

publisher = "IEEE",

pages = "292--297",

booktitle = "Digest of Papers - FTCS (Fault-Tolerant Computing Symposium)",

}

TY - GEN

T1 - BUILT-IN TEST FOR VLSI FINITE-STATE MACHINES.

AU - Hua, Kien A.

AU - Jou, Jing Yang

AU - Abraham, Jacob A.

PY - 1984

Y1 - 1984

UR - http://www.scopus.com/inward/record.url?scp=0021183635&partnerID=8YFLogxK

M3 - 會議論文篇章

AN - SCOPUS:0021183635

SN - 0818605405

T3 - Digest of Papers - FTCS (Fault-Tolerant Computing Symposium)

SP - 292

EP - 297

BT - Digest of Papers - FTCS (Fault-Tolerant Computing Symposium)

PB - IEEE

ER -