Built-in self-test and self-diagnosis scheme for embedded SRAM

Keyphrases

• Built-in-self-test (BiST) 100%
• Embedded SRAM 100%
• Self-diagnosis 100%
• Built-in Self-Diagnosis 100%
• Diagnosis Scheme 100%
• Test Diagnostics 100%
• System-on-chip 25%
• Hardware Overhead 25%
• Design Yield 25%
• Yield Improvement 25%
• Design Verification 25%
• Manufacturing Test 25%
• March Test Algorithm 25%
• Fault Diagnosis System 25%
• Memory Diagnosis 25%
• Embedded Memory Test 25%
• Manufacturing Diagnosis 25%

Computer Science

• build-in self-test 100%
• Experimental Result 50%
• Test Algorithm 50%
• Input/Output 50%
• embedded memory 50%
• Design Verification 50%
• Hardware Overhead 50%
• Acceptable Solution 50%
• fault diagnose method 50%
• Manufacturing Test 50%
• System-on-Chip 50%

Engineering

• Built-in Self Test 100%
• Experimental Result 50%
• System-on-Chip 50%
• Fault Diagnosis 50%
• Hardware Overhead 50%
• Design Verification 50%
• Limited Number 50%
• Acceptable Solution 50%