Bit error rate measurement system for RF integrated circuits

Hsu Feng Hsiao, Shuw Guann Lin, Sy Haur Su, Chih Ho Tu, Da Chiang Chang, Ying Zong Juang, Hwann Kaeo Chiou

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Scopus citations

Abstract

This paper proposes a bit error rate (BER) measurement system utilizing vector signal analyzer (VSA) instrument built-in analog digital converter (ADC) and ideal digital baseband receiver of VSA software for RF integrated circuits (RFICs) such as RF amplifier, RF mixer and RF receiver. Usually, BER performance is estimated in transceiver with built-in digital baseband circuits. In the past, RF designers could not estimate RFICs effect to BER test without digital baseband circuits and vice versa for digital baseband designers. It is helpful to understand RFICs without digital baseband circuits to BER test can reduce certain risk before integrating RFICs with digital baseband circuits. Therefore, an implementation of output signal to noise ratio (SNR) calibration in a specified bandwidth and measurement method combined VSA instrument, VSA software and Advanced Design System (ADS) is used for BER measurement.

Original languageEnglish
Title of host publication2012 IEEE I2MTC - International Instrumentation and Measurement Technology Conference, Proceedings
Pages2381-2384
Number of pages4
DOIs
StatePublished - 2012
Event2012 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2012 - Graz, Austria
Duration: 13 May 201216 May 2012

Publication series

Name2012 IEEE I2MTC - International Instrumentation and Measurement Technology Conference, Proceedings

Conference

Conference2012 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2012
Country/TerritoryAustria
CityGraz
Period13/05/1216/05/12

Keywords

  • Analog digital converter
  • bit error rate
  • digital baseband circuits
  • measurement
  • RF integrated circuits
  • vector signal analyzer

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