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BIST scheme for DAC testing
S. J. Chang, C. L. Lee, J. E. Chen
Department of Electrical Engineering
Research output
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Contribution to journal
›
Article
›
peer-review
23
Scopus citations
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Keyphrases
Built-in-self-test (BiST)
100%
Digital-to-analog Converter
100%
Converter Testing
100%
Digital Circuits
20%
Coding Performance
20%
Output Voltage
20%
Voltage-controlled Oscillator
20%
Output Codes
20%
Output Noise
20%
Oscillation Frequency
20%
Digital Code
20%
Differential Nonlinearity
20%
Far Transfer
20%
Integral Nonlinearity
20%
Gain Error
20%
Offset Error
20%
Engineering
Built-in Self Test
100%
Digital-to-Analog Converter
100%
Nonlinearity
40%
Digital Circuits
20%
Output Voltage
20%
Voltage-Controlled Oscillator
20%
Test Method
20%
Output Noise
20%
Digital Code
20%
Output Code
20%
Code Performance
20%
Offset Error
20%
Physics
Self Test
100%