Bayesian inference of a series system on weibull step-stress accelerated life tests with dependent masking

Tsai Hung Fan, Tsung Ming Hsu, Kuan Jung Peng

Research output: Contribution to journalArticlepeer-review

18 Scopus citations

Abstract

We will discuss the reliability analysis of a series system under the step-stress accelerated lifetime test with Type-I censoring scheme while the components are assumed to have independent and non-identical Weibull lifetime distributions and the lifetime of each component all follows the cumulative exposure model. In many cases, the exact component causing the failure of the system cannot be identified and the cause of failure is masked. We adopt the log-linear relationship between the stress variables and the Weibull scale parameters and apply the Bayesian analysis from masked system life data when the probability of masking is dependent on different components. Further, the reliability of the system and components are estimated under usual operating conditions. The proposed method is illustrated through a simulation study.

Original languageEnglish
Pages (from-to)291-303
Number of pages13
JournalQuality Technology and Quantitative Management
Volume10
Issue number3
DOIs
StatePublished - Sep 2013

Keywords

  • Cumulative exposure model
  • Masked
  • Step-stress accelerated lifetime test
  • Type-I censoring

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