Attenuation in waveguides on FR-4 boards due to periodic substrate undulations

Yin Jung Chang; Thomas K. Gaylord; Gee Kung Chang

doi:10.1364/AO.46.002234

Attenuation in waveguides on FR-4 boards due to periodic substrate undulations

Yin Jung Chang, Thomas K. Gaylord, Gee Kung Chang

Department of Optics and Photonics

Research output: Contribution to journal › Article › peer-review

7 Scopus citations

Abstract

The guided-mode attenuation associated with optical-interconnect-polymer waveguides fabricated on FR-4 printed-circuit boards is quantified. The rigorous transmission-line network approach is used and the FR-4 substrate is treated as a long-period substrate grating. A quantitative metric for an appropriate matrix truncation is presented. The peaks of attenuation are shown to occur near the Bragg conditions that characterize the leaky-wave stop bands. For a typical 400 μm period FR-4 substrate with an 8 μm corrugation depth, a buffer layer thickness of about 40 μm is found to be needed to make the attenuation negligibly small.

Original language	English
Pages (from-to)	2234-2243
Number of pages	10
Journal	Applied Optics
Volume	46
Issue number	12
DOIs	https://doi.org/10.1364/AO.46.002234
State	Published - 20 Apr 2007

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abstract = "The guided-mode attenuation associated with optical-interconnect-polymer waveguides fabricated on FR-4 printed-circuit boards is quantified. The rigorous transmission-line network approach is used and the FR-4 substrate is treated as a long-period substrate grating. A quantitative metric for an appropriate matrix truncation is presented. The peaks of attenuation are shown to occur near the Bragg conditions that characterize the leaky-wave stop bands. For a typical 400 μm period FR-4 substrate with an 8 μm corrugation depth, a buffer layer thickness of about 40 μm is found to be needed to make the attenuation negligibly small.",

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N2 - The guided-mode attenuation associated with optical-interconnect-polymer waveguides fabricated on FR-4 printed-circuit boards is quantified. The rigorous transmission-line network approach is used and the FR-4 substrate is treated as a long-period substrate grating. A quantitative metric for an appropriate matrix truncation is presented. The peaks of attenuation are shown to occur near the Bragg conditions that characterize the leaky-wave stop bands. For a typical 400 μm period FR-4 substrate with an 8 μm corrugation depth, a buffer layer thickness of about 40 μm is found to be needed to make the attenuation negligibly small.

AB - The guided-mode attenuation associated with optical-interconnect-polymer waveguides fabricated on FR-4 printed-circuit boards is quantified. The rigorous transmission-line network approach is used and the FR-4 substrate is treated as a long-period substrate grating. A quantitative metric for an appropriate matrix truncation is presented. The peaks of attenuation are shown to occur near the Bragg conditions that characterize the leaky-wave stop bands. For a typical 400 μm period FR-4 substrate with an 8 μm corrugation depth, a buffer layer thickness of about 40 μm is found to be needed to make the attenuation negligibly small.

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M3 - 期刊論文

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JO - Applied Optics

JF - Applied Optics

IS - 12

ER -

Attenuation in waveguides on FR-4 boards due to periodic substrate undulations

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