Apply tapping mode atomic force microscope with CD/DVD pickup head in fluid

Shih Hsun Yen, Jim Wei Wu, Li Chen Fu

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Scopus citations

Abstract

This paper proposes a tapping mode scanning sample type Atomic Force Microscope (AFM) equipped with a CD/DVD pick-up-head (PUH) used to measure the deflection of the cantilever beam of the probe in the liquid. To start with, we build an adaptive Quality-Factor-controller (Q-controller) to modulate the interaction force between the tip and the sample. To implement the above systems, we have designed a novel AFM mechanism and proposed an adaptive sliding-mode controller for it. For testing the system capability and analyzing the biomorphic change of the sample in liquid, we have conducted a series of experiments, and the results can help us to understand more about the mechanism of the sample in liquid.

Original languageEnglish
Title of host publicationProceedings of the 2010 American Control Conference, ACC 2010
Pages6549-6554
Number of pages6
StatePublished - 2010
Event2010 American Control Conference, ACC 2010 - Baltimore, MD, United States
Duration: 30 Jun 20102 Jul 2010

Publication series

NameProceedings of the 2010 American Control Conference, ACC 2010

Conference

Conference2010 American Control Conference, ACC 2010
Country/TerritoryUnited States
CityBaltimore, MD
Period30/06/102/07/10

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