Angular line scanning deflectometry using a laser pico projector

Hao Xun Zhan, Chao Wen Liang, Shih Che Chien

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In our previous publications, we had successfully made a deflectometry measurement by using a portable laser projector. In this research, we propose the beam weighting centroid method rather than previous the phase shifting method for quantification of the angular direction of the testing beam in the tested optics entrance pupil. By projecting the angular sequential lines on tested optics entrance pupil, the wavefront aberration is reconstructed from two orthogonal directions measurements, in a similar way to the line scanning deflectometry. The limited gray scale problem of laser projector during the phase shifting measurement is therefore eliminated. The reconstructed wavefront is proven to yield a more accurate result than the phase shifting methods at the cost of more image frames and acquisition time.

Original languageEnglish
Title of host publicationInterferometry XVIII
EditorsArmando Albertazzi Goncalves, Katherine Creath, Jan Burke
PublisherSPIE
ISBN (Electronic)9781510603110
DOIs
StatePublished - 2016
EventInterferometry XVIII - San Diego, United States
Duration: 30 Aug 20161 Sep 2016

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume9960
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceInterferometry XVIII
Country/TerritoryUnited States
CitySan Diego
Period30/08/161/09/16

Keywords

  • applied optics
  • deflectometry
  • laser projector
  • line scanning
  • transverse ray aberration
  • Wavefront sensing

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