Analysis of accelerated degradation data in a two-way design

Dong Shang Chang

doi:10.1016/0951-8320(93)90148-R

Analysis of accelerated degradation data in a two-way design

Dong Shang Chang

Department of Business Administration

Research output: Contribution to journal › Article › peer-review

14 Scopus citations

Abstract

In this paper a generalized Eyring model is used to describe the dependence of performance, aging and accelerated stresses in a power supply. The tests considered here involve multiple measurements collected by automatic monitor system in a two-way design. The expected time to failure of a power supply at the use condition is estimated.

Original language	English
Pages (from-to)	65-69
Number of pages	5
Journal	Reliability Engineering and System Safety
Volume	39
Issue number	1
DOIs	https://doi.org/10.1016/0951-8320(93)90148-R
State	Published - 1993

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Analysis of accelerated degradation data in a two-way design

Abstract

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