Analysis of accelerated degradation data in a two-way design

Research output: Contribution to journalArticlepeer-review

14 Scopus citations


In this paper a generalized Eyring model is used to describe the dependence of performance, aging and accelerated stresses in a power supply. The tests considered here involve multiple measurements collected by automatic monitor system in a two-way design. The expected time to failure of a power supply at the use condition is estimated.

Original languageEnglish
Pages (from-to)65-69
Number of pages5
JournalReliability Engineering and System Safety
Issue number1
StatePublished - 1993


Dive into the research topics of 'Analysis of accelerated degradation data in a two-way design'. Together they form a unique fingerprint.

Cite this