An efficient test and diagnosis scheme for the feedback type of analog circuits with minimal added circuits

Jun Weir Lin, Chung Len Lee, Jwu E. Chen

Research output: Contribution to journalArticlepeer-review

Abstract

This paper presents a test and diagnosis scheme for feedback type of linear analog circuits with minimal added circuits. For testing, the scheme transforms the circuit-under-test (CUT) into an oscillation circuit by: (1) increasing the loop gain of the circuit, and/or (2) reconfiguring the circuit through selectively powering-off operational amplifiers (OP) of the circuit. This eliminates the need of added global paths as in the conventional oscillation test scheme. For diagnosis, the scheme transforms the circuit into a Schmitt trigger type of circuit with positive-feedback. The output of the circuit under an applied triangular input gives signatures which are then used to identify faults. Benchmark circuits have been applied with this scheme and results show that it is very effective for the testing and diagnosing of the feedback type of linear analog circuit.

Original languageEnglish
Pages (from-to)91-98
Number of pages8
JournalJournal of the Chinese Institute of Electrical Engineering, Transactions of the Chinese Institute of Engineers, Series E/Chung KuoTien Chi Kung Chieng Hsueh K'an
Volume10
Issue number1
StatePublished - Feb 2003

Keywords

  • Disabling OPs
  • Feedback type circuit
  • Loop-gain increment
  • Oscillation test
  • Positive-feedback loops

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