An efficient diagnosis scheme for RAMs with simple functional faults

Jin Fu Li, Chao Da Huang

Research output: Contribution to journalArticlepeer-review

Abstract

This paper presents an efficient diagnosis scheme for RAMs. Three March-based algorithms are proposed to diagnose simple functional faults of RAMs. A March-15N algorithm is used for locating and partially diagnosing faults of bit-oriented or word-oriented memories, where N represents the address number. Then a 3N March-like algorithm is used for locating the aggressor words (bits) of coupling faults (CFs) in word-oriented (bit-oriented) memories. It also can distinguish the faults which cannot be identified by the March-15N algorithm. Thus, the proposed diagnosis scheme can achieve full diagnosis and locate aggressors with (15N + 3mN) Read/Write operations for a bit-oriented RAM with m CFs. For word-oriented RAMs, a March-like algorithm is also proposed to locate the aggressor bit in the aggressor word with 4 log2 B Read/Write operations, where B is the word width. Analysis results show that the proposed diagnosis scheme has higher diagnostic resolution and lower time complexity than the previous fault location and fault diagnosis approaches. A programmable built-in self-diagnosis (BISD) design is also implemented to perform the proposed diagnosis algorithms. Experimental results show that the area overhead of the BISD is small - only about 2.17% and 0.42% for 16 K×8-bit and 16 K×128-bit SRAMs, respectively.

Original languageEnglish
Pages (from-to)2703-2711
Number of pages9
JournalIEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
VolumeE90-A
Issue number12
DOIs
StatePublished - Dec 2007

Keywords

  • Built-in selfdiagnosis
  • Coupling faults
  • Diagnosis
  • March test
  • Random access memories

Fingerprint

Dive into the research topics of 'An efficient diagnosis scheme for RAMs with simple functional faults'. Together they form a unique fingerprint.

Cite this