Ammonia impurities critical to the performance of nitride semiconductor devices

R. Torres, J. Vininski, C. Wyse, J. I. Chyi, G. T. Chen

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Scopus citations

Fingerprint

Dive into the research topics of 'Ammonia impurities critical to the performance of nitride semiconductor devices'. Together they form a unique fingerprint.

Engineering & Materials Science