Alternative displacement sensor with reflection type holographic grating

Yao Yaun Ho, Zhi Ru Lin, Cheng Chih Hsu, Chyan Chyi Wu, Ju Yi Lee

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In this study, we proposed an alternative displacement sensor which constructed with reflection type holographic diffraction grating. To integrate with the truly phase detection heterodyne interferometer, and then the in-plane displacement can be measured with sub-nanometer displacement resolution. The smallest variation can be observed of proposed method is approximately 20 pm and there are no significant differences between proposed method and comparison methods. Furthermore, we evaluated the thermal property of the hologram and showed that the grating pitch variation is smaller than 0.1 nm for temperature variations within 1 °C. According to these findings, we can conclude that the holographic grating can be an alternative displacement sensor with high sensitivity and high stability.

Original languageEnglish
Title of host publicationInternational Conference on Optics in Precision Engineering and Nanotechnology, icOPEN 2013
DOIs
StatePublished - 2013
EventInternational Conference on Optics in Precision Engineering and Nanotechnology, icOPEN 2013 - Singapore, Singapore
Duration: 9 Apr 201311 Apr 2013

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume8769
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceInternational Conference on Optics in Precision Engineering and Nanotechnology, icOPEN 2013
Country/TerritorySingapore
CitySingapore
Period9/04/1311/04/13

Keywords

  • Displacement sensor
  • Grating interferometer
  • Holographic grating

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