Adaptive encoding scheme for test volume/time reduction in SOC scan testing

Shih Ping Lin, Chung Len Lee, Jwu E. Chen

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Scopus citations

Abstract

Scan test for SoC has now suffered large data volume and test application time. In this paper, we propose and demonstrate an Adaptive Encoding scheme to reduce the test volume and test time for SoC scan test. The scheme, instead of handling test data themselves, encodes them in "packets" according to difference bits of two consecutive test patterns. A decoder machine is designed to decode the compressed data and a repeat filling mechanism from the ATE is adopted to eliminate the synchronization problem. It supports variable block size and is flexible in encoding multi-core test patterns; therefore, the proposed method is effective in SoC scan test. Experimental results show that on average the scheme achieves 73% reduction in test data and more than 16 times of speedup in test application time.

Original languageEnglish
Title of host publicationProceedings - 14th Asian Test Symposium, ATS 2005
Pages324-329
Number of pages6
DOIs
StatePublished - 2005
Event14th Asian Test Symposium, ATS 2005 - Calcutta, India
Duration: 18 Dec 200521 Dec 2005

Publication series

NameProceedings of the Asian Test Symposium
Volume2005
ISSN (Print)1081-7735

Conference

Conference14th Asian Test Symposium, ATS 2005
Country/TerritoryIndia
CityCalcutta
Period18/12/0521/12/05

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