Adaptive de-noising filter algorithm for CMOS image sensor testing applications

Chun Lung Hsu, Chen Wei Lan, Yu Chih Lo, Yu Sheng Huang

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

4 Scopus citations

Abstract

This paper proposes an adaptive de-nosing filter (ADF) algorithm to effectively remove the image defects for the CMOS image sensor testing applications. Based on the median filter technique, the proposed ADF algorithm develops a pre-processing method to generate adaptive detection windows for pixel defect de-noising of an image. Experimental results and comparisons show that the proposed ADF algorithm can provide a significant ability of defects de-noising for supporting good performance in peak signal-to-noise ratio (PSNR) and image quality.

Original languageEnglish
Title of host publicationProceedings - 2010 25th International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2010
Pages136-143
Number of pages8
DOIs
StatePublished - 2010
Event2010 25th International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2010 - Kyoto, Japan
Duration: 6 Oct 20108 Oct 2010

Publication series

NameProceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
ISSN (Print)1550-5774

Conference

Conference2010 25th International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2010
Country/TerritoryJapan
CityKyoto
Period6/10/108/10/10

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